APA (7th ed.) Citation

Национальный исследовательский Томский политехнический университет Физико-технический институт, Gogolev A. S. Aleksey Sergeevich, Rezaev R. O. Roman Olegovich, Cherepennikov Yu. M. Yuriy Mihaylovich, Vukolov A. V. Artem Vladimirovich, & Gogoleva T. S. Tatiana Sergeevna. (2016). Estimation of the sensitivity in dual wave X-ray absorptiometry; Journal of Physics: Conference Series; Vol. 732 : Radiation from Relativistic Electrons in Periodic Structures (RREPS2015). 2016. https://doi.org/10.1088/1742-6596/732/1/012032

Chicago Style (17th ed.) Citation

Национальный исследовательский Томский политехнический университет Физико-технический институт, Gogolev A. S. Aleksey Sergeevich, Rezaev R. O. Roman Olegovich, Cherepennikov Yu. M. Yuriy Mihaylovich, Vukolov A. V. Artem Vladimirovich, and Gogoleva T. S. Tatiana Sergeevna. Estimation of the Sensitivity in Dual Wave X-ray Absorptiometry; Journal of Physics: Conference Series; Vol. 732 : Radiation from Relativistic Electrons in Periodic Structures (RREPS2015). 2016, 2016. https://doi.org/10.1088/1742-6596/732/1/012032.

MLA (9th ed.) Citation

Национальный исследовательский Томский политехнический университет Физико-технический институт, et al. Estimation of the Sensitivity in Dual Wave X-ray Absorptiometry; Journal of Physics: Conference Series; Vol. 732 : Radiation from Relativistic Electrons in Periodic Structures (RREPS2015). 2016, 2016. https://doi.org/10.1088/1742-6596/732/1/012032.