Influence of temperature gradient on diffracted X-ray spectrum in quartz crystal
| Parent link: | IOP Conference Series: Materials Science and Engineering Vol. 135 : Issues of Physics and Technology in Science, Industry and Medicine.— 2016.— [012028, 5 p.] |
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| Egile korporatiboa: | , |
| Beste egile batzuk: | , , , , , , |
| Gaia: | Title screen In this work characteristics of hard X-ray (with energy higher than 30 keV) were investigated. In the experiment we measured spectra of X-ray reflected by a quartz monocrystal in Laue geometry under influence of the temperature gradient. The measurements were made by the spectrometer BDER-KI-11K with 300 eV resolution on the 17.74 keV spectral line of Am241 and the spectrometer XR-100CR with 270 eV resolution on the same spectral line. An existence of temperature gradient leads to increasing of the diffracted beam intensity. The intensity was measured dependently on the temperature of one of the edge of the crystal. |
| Hizkuntza: | ingelesa |
| Argitaratua: |
2016
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| Gaiak: | |
| Sarrera elektronikoa: | http://dx.doi.org/10.1088/1757-899X/135/1/012028 http://earchive.tpu.ru/handle/11683/34817 |
| Formatua: | Baliabide elektronikoa Liburu kapitulua |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=650306 |
MARC
| LEADER | 00000nla2a2200000 4500 | ||
|---|---|---|---|
| 001 | 650306 | ||
| 005 | 20240217190354.0 | ||
| 035 | |a (RuTPU)RU\TPU\network\15518 | ||
| 035 | |a RU\TPU\network\15514 | ||
| 090 | |a 650306 | ||
| 100 | |a 20160930a2016 k y0engy50 ba | ||
| 101 | 0 | |a eng | |
| 102 | |a GB | ||
| 105 | |a y z 100zy | ||
| 135 | |a drcn ---uucaa | ||
| 181 | 0 | |a i | |
| 182 | 0 | |a b | |
| 200 | 1 | |a Influence of temperature gradient on diffracted X-ray spectrum in quartz crystal |f A. R. Mkrtchan (Mkrtchyan) [et al.] | |
| 203 | |a Text |c electronic | ||
| 300 | |a Title screen | ||
| 320 | |a [References: 9 tit.] | ||
| 330 | |a In this work characteristics of hard X-ray (with energy higher than 30 keV) were investigated. In the experiment we measured spectra of X-ray reflected by a quartz monocrystal in Laue geometry under influence of the temperature gradient. The measurements were made by the spectrometer BDER-KI-11K with 300 eV resolution on the 17.74 keV spectral line of Am241 and the spectrometer XR-100CR with 270 eV resolution on the same spectral line. An existence of temperature gradient leads to increasing of the diffracted beam intensity. The intensity was measured dependently on the temperature of one of the edge of the crystal. | ||
| 461 | 0 | |0 (RuTPU)RU\TPU\network\2008 |t IOP Conference Series: Materials Science and Engineering | |
| 463 | 0 | |0 (RuTPU)RU\TPU\network\15011 |t Vol. 135 : Issues of Physics and Technology in Science, Industry and Medicine |o VIII International Scientific Conference, 1–3 June 2016, Tomsk, Russia |o [proceedings] |v [012028, 5 p.] |d 2016 | |
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 610 | 1 | |a температурные градиенты | |
| 610 | 1 | |a рентгеновские спектры | |
| 610 | 1 | |a кристаллы | |
| 610 | 1 | |a кварц | |
| 610 | 1 | |a рентгеновские излучения | |
| 701 | 1 | |a Mkrtchan (Mkrtchyan) |b A. R. |c physicist |c Professor of Tomsk Polytechnic University, Doctor of physical and mathematical sciences |f 1937- |g Alpik Rafaelovich |3 (RuTPU)RU\TPU\pers\34236 | |
| 701 | 1 | |a Potylitsyn |b A. P. |c Russian physicist |c Professor of the TPU |f 1945- |g Alexander Petrovich |3 (RuTPU)RU\TPU\pers\26306 |9 12068 | |
| 701 | 1 | |a Vukolov |b A. V. |c physicist |c Research associate of Tomsk Polytechnic University, Candidate of physical and mathematical sciences |f 1978- |g Artem Vladimirovich |3 (RuTPU)RU\TPU\pers\31209 |9 15405 | |
| 701 | 1 | |a Novokshonov |b A. I. |c specialist in the field of non-destructive testing |c engineer of Tomsk Polytechnic University |f 1990- |g Artem Igorevich |3 (RuTPU)RU\TPU\pers\35523 | |
| 701 | 1 | |a Gogolev |b A. S. |c physicist |c associate professor of Tomsk Polytechnic University, Candidate of physical and mathematical sciences |f 1983- |g Aleksey Sergeevich |3 (RuTPU)RU\TPU\pers\31537 |9 15698 | |
| 701 | 1 | |a Amiragyan |b R. V. | |
| 701 | 1 | |a Movsisyan |b A. E. | |
| 712 | 0 | 2 | |a Национальный исследовательский Томский политехнический университет (ТПУ) |b Физико-технический институт (ФТИ) |b Кафедра прикладной физики (№ 12) (ПФ) |3 (RuTPU)RU\TPU\col\18729 |
| 712 | 0 | 2 | |a Национальный исследовательский Томский политехнический университет (ТПУ) |b Физико-технический институт (ФТИ) |b Кафедра прикладной физики (№ 12) (ПФ) |b Международная научно-образовательная лаборатория "Рентгеновская оптика" (МНОЛ РО) |3 (RuTPU)RU\TPU\col\19530 |
| 801 | 2 | |a RU |b 63413507 |c 20170120 |g RCR | |
| 856 | 4 | |u http://dx.doi.org/10.1088/1757-899X/135/1/012028 | |
| 856 | 4 | |u http://earchive.tpu.ru/handle/11683/34817 | |
| 942 | |c CF | ||