Influence of temperature gradient on diffracted X-ray spectrum in quartz crystal

Bibliographic Details
Parent link:IOP Conference Series: Materials Science and Engineering
Vol. 135 : Issues of Physics and Technology in Science, Industry and Medicine.— 2016.— [012028, 5 p.]
Corporate Authors: Национальный исследовательский Томский политехнический университет (ТПУ) Физико-технический институт (ФТИ) Кафедра прикладной физики (№ 12) (ПФ), Национальный исследовательский Томский политехнический университет (ТПУ) Физико-технический институт (ФТИ) Кафедра прикладной физики (№ 12) (ПФ) Международная научно-образовательная лаборатория "Рентгеновская оптика" (МНОЛ РО)
Other Authors: Mkrtchan (Mkrtchyan) A. R. Alpik Rafaelovich, Potylitsyn A. P. Alexander Petrovich, Vukolov A. V. Artem Vladimirovich, Novokshonov A. I. Artem Igorevich, Gogolev A. S. Aleksey Sergeevich, Amiragyan R. V., Movsisyan A. E.
Summary:Title screen
In this work characteristics of hard X-ray (with energy higher than 30 keV) were investigated. In the experiment we measured spectra of X-ray reflected by a quartz monocrystal in Laue geometry under influence of the temperature gradient. The measurements were made by the spectrometer BDER-KI-11K with 300 eV resolution on the 17.74 keV spectral line of Am241 and the spectrometer XR-100CR with 270 eV resolution on the same spectral line. An existence of temperature gradient leads to increasing of the diffracted beam intensity. The intensity was measured dependently on the temperature of one of the edge of the crystal.
Published: 2016
Subjects:
Online Access:http://dx.doi.org/10.1088/1757-899X/135/1/012028
http://earchive.tpu.ru/handle/11683/34817
Format: Electronic Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=650306