Еlectron microscopy studies of near-surface layers of ZRO2(Y)-AL2O3 composite ceramic modified by high-current beam of low-energy electrons; Inorganic Materials: Applied Research; Vol. 5, iss. 5
| Parent link: | Inorganic Materials: Applied Research: Scientific Journal.— , 2010- Vol. 5, iss. 5.— 2014.— [P. 536-539] |
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| Kurumsal yazarlar: | , |
| Diğer Yazarlar: | , , , |
| Özet: | Title screen The influence of a high-current pulsed beam of low-energy electrons (HCBLE) on the structural state of near-surface layers of ZrO2(Y)-Al2O3 composite ceramic with various levels of porosity is studied using scanning electron microscopy (SEM). It is demonstrated that the electron processing leads to melting and subsequent crystallization of the ceramic near-surface layer with thickness of 30-40 μm. The surface microstructure and cross section of electron-beam-modified layers of ceramic specimens are analyzed using SEM. It is revealed that, in the irradiated near-surface layer of all considered ceramic types, there are actually no pores and grains of the corundum phase. It is found that electron beam irradiation leads to a decrease in grain size and formation of texture in the near-surface layers. Режим доступа: по договору с организацией-держателем ресурса |
| Dil: | İngilizce |
| Baskı/Yayın Bilgisi: |
2014
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| Konular: | |
| Online Erişim: | http://dx.doi.org/10.1134/S2075113314050219 |
| Materyal Türü: | Elektronik Kitap Bölümü |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=649250 |
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| 200 | 1 | |a Еlectron microscopy studies of near-surface layers of ZRO2(Y)-AL2O3 composite ceramic modified by high-current beam of low-energy electrons |f A. P. Surzhikov, Т. S. Frangulyan, S. A. Ghyngazov, I. P. Vasiljev | |
| 203 | |a Text |c electronic | ||
| 300 | |a Title screen | ||
| 320 | |a [References: p. 539 (5 tit.)] | ||
| 330 | |a The influence of a high-current pulsed beam of low-energy electrons (HCBLE) on the structural state of near-surface layers of ZrO2(Y)-Al2O3 composite ceramic with various levels of porosity is studied using scanning electron microscopy (SEM). It is demonstrated that the electron processing leads to melting and subsequent crystallization of the ceramic near-surface layer with thickness of 30-40 μm. The surface microstructure and cross section of electron-beam-modified layers of ceramic specimens are analyzed using SEM. It is revealed that, in the irradiated near-surface layer of all considered ceramic types, there are actually no pores and grains of the corundum phase. It is found that electron beam irradiation leads to a decrease in grain size and formation of texture in the near-surface layers. | ||
| 333 | |a Режим доступа: по договору с организацией-держателем ресурса | ||
| 461 | |t Inorganic Materials: Applied Research |o Scientific Journal |d 2010- | ||
| 463 | |t Vol. 5, iss. 5 |v [P. 536-539] |d 2014 | ||
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| 701 | 1 | |a Surzhikov |b A. P. |c physicist |c Professor of Tomsk Polytechnic University, doctor of physical and mathematical sciences (DSc) |f 1951- |g Anatoly Petrovich |3 (RuTPU)RU\TPU\pers\30237 |9 14617 | |
| 701 | 1 | |a Frangulyan (Franguljyan) |b Т. S. |c specialist in the field of electronics, dielectrics and semiconductors |c leading researcher of Tomsk Polytechnic University, candidate of physical and mathematical Sciences |f 1940- |g Tamara Semenovna |3 (RuTPU)RU\TPU\pers\33975 |9 17548 | |
| 701 | 1 | |a Gyngazov (Ghyngazov) |b S. A. |c specialist in the field of electronics |c Professor of Tomsk Polytechnic University, Doctor of technical sciences |f 1958- |g Sergey Anatolievich |3 (RuTPU)RU\TPU\pers\33279 |9 17024 | |
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