Еlectron microscopy studies of near-surface layers of ZRO2(Y)-AL2O3 composite ceramic modified by high-current beam of low-energy electrons

Bibliographic Details
Parent link:Inorganic Materials: Applied Research: Scientific Journal.— , 2010-
Vol. 5, iss. 5.— 2014.— [P. 536-539]
Corporate Authors: Национальный исследовательский Томский политехнический университет Институт неразрушающего контроля Проблемная научно-исследовательская лаборатория электроники, диэлектриков и полупроводников, Национальный исследовательский Томский политехнический университет Институт неразрушающего контроля Кафедра физических методов и приборов контроля качества
Other Authors: Surzhikov A. P. Anatoly Petrovich, Frangulyan (Franguljyan) Т. S. Tamara Semenovna, Gyngazov (Ghyngazov) S. A. Sergey Anatolievich, Vasiljev I. P. Ivan Petrovich
Summary:Title screen
The influence of a high-current pulsed beam of low-energy electrons (HCBLE) on the structural state of near-surface layers of ZrO2(Y)-Al2O3 composite ceramic with various levels of porosity is studied using scanning electron microscopy (SEM). It is demonstrated that the electron processing leads to melting and subsequent crystallization of the ceramic near-surface layer with thickness of 30-40 μm. The surface microstructure and cross section of electron-beam-modified layers of ceramic specimens are analyzed using SEM. It is revealed that, in the irradiated near-surface layer of all considered ceramic types, there are actually no pores and grains of the corundum phase. It is found that electron beam irradiation leads to a decrease in grain size and formation of texture in the near-surface layers.
Режим доступа: по договору с организацией-держателем ресурса
Language:English
Published: 2014
Subjects:
Online Access:http://dx.doi.org/10.1134/S2075113314050219
Format: Electronic Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=649250