Three-axis MEMS Accelerometer for Structural Inspection

Bibliografski detalji
Parent link:Journal of Physics: Conference Series
Vol. 671 : Innovations in Non-Destructive Testing (SibTest 2015).— 2016.— [012003, 6 p.]
Autor kompanije: Национальный исследовательский Томский политехнический университет
Daljnji autori: Barbin E. S. Evgeny Sergeevich, Koleda A. N. Aleksey Nikolaevich, Nesterenko T. G. Tamara Georgievna, Vtorushin S.
Sažetak:Title screen
Microelectromechanical system accelerometers are widely used for metrological measurements of acceleration, tilt, vibration, and shock in moving objects. The paper presents the analysis of MEMS accelerometer that can be used for the structural inspection. ANSYS Multiphysics platform is used to simulate the behavior of MEMS accelerometer by employing a finite element model and MATLAB/Simulink tools for modeling nonlinear dynamic systems.
Режим доступа: по договору с организацией-держателем ресурса
Jezik:engleski
Izdano: 2016
Teme:
Online pristup:http://dx.doi.org/10.1088/1742-6596/671/1/012003
http://earchive.tpu.ru/handle/11683/33744
Format: Elektronički Poglavlje knjige
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=647134

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