Three-axis MEMS Accelerometer for Structural Inspection; Journal of Physics: Conference Series; Vol. 671 : Innovations in Non-Destructive Testing (SibTest 2015)

Detalhes bibliográficos
Parent link:Journal of Physics: Conference Series
Vol. 671 : Innovations in Non-Destructive Testing (SibTest 2015).— 2016.— [012003, 6 p.]
Autor Corporativo: Томский политехнический университет
Outros Autores: Barbin E. S. Evgeny Sergeevich, Koleda A. N. Aleksey Nikolaevich, Nesterenko T. G. Tamara Georgievna, Vtorushin S.
Resumo:Title screen
Microelectromechanical system accelerometers are widely used for metrological measurements of acceleration, tilt, vibration, and shock in moving objects. The paper presents the analysis of MEMS accelerometer that can be used for the structural inspection. ANSYS Multiphysics platform is used to simulate the behavior of MEMS accelerometer by employing a finite element model and MATLAB/Simulink tools for modeling nonlinear dynamic systems.
Режим доступа: по договору с организацией-держателем ресурса
Idioma:inglês
Publicado em: 2016
Assuntos:
Acesso em linha:http://dx.doi.org/10.1088/1742-6596/671/1/012003
http://earchive.tpu.ru/handle/11683/33744
Formato: Recurso Electrónico Capítulo de Livro
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=647134

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