Three-axis MEMS Accelerometer for Structural Inspection

書誌詳細
Parent link:Journal of Physics: Conference Series
Vol. 671 : Innovations in Non-Destructive Testing (SibTest 2015).— 2016.— [012003, 6 p.]
団体著者: Национальный исследовательский Томский политехнический университет
その他の著者: Barbin E. S. Evgeny Sergeevich, Koleda A. N. Aleksey Nikolaevich, Nesterenko T. G. Tamara Georgievna, Vtorushin S.
要約:Title screen
Microelectromechanical system accelerometers are widely used for metrological measurements of acceleration, tilt, vibration, and shock in moving objects. The paper presents the analysis of MEMS accelerometer that can be used for the structural inspection. ANSYS Multiphysics platform is used to simulate the behavior of MEMS accelerometer by employing a finite element model and MATLAB/Simulink tools for modeling nonlinear dynamic systems.
Режим доступа: по договору с организацией-держателем ресурса
言語:英語
出版事項: 2016
主題:
オンライン・アクセス:http://dx.doi.org/10.1088/1742-6596/671/1/012003
http://earchive.tpu.ru/handle/11683/33744
フォーマット: 電子媒体 図書の章
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=647134