Three-axis MEMS Accelerometer for Structural Inspection; Journal of Physics: Conference Series; Vol. 671 : Innovations in Non-Destructive Testing (SibTest 2015)
| Parent link: | Journal of Physics: Conference Series Vol. 671 : Innovations in Non-Destructive Testing (SibTest 2015).— 2016.— [012003, 6 p.] |
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| Institution som forfatter: | |
| Andre forfattere: | , , , |
| Summary: | Title screen Microelectromechanical system accelerometers are widely used for metrological measurements of acceleration, tilt, vibration, and shock in moving objects. The paper presents the analysis of MEMS accelerometer that can be used for the structural inspection. ANSYS Multiphysics platform is used to simulate the behavior of MEMS accelerometer by employing a finite element model and MATLAB/Simulink tools for modeling nonlinear dynamic systems. Режим доступа: по договору с организацией-держателем ресурса |
| Sprog: | engelsk |
| Udgivet: |
2016
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| Fag: | |
| Online adgang: | http://dx.doi.org/10.1088/1742-6596/671/1/012003 http://earchive.tpu.ru/handle/11683/33744 |
| Format: | MixedMaterials Electronisk Book Chapter |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=647134 |