Three-axis MEMS Accelerometer for Structural Inspection

Bibliographic Details
Parent link:Journal of Physics: Conference Series
Vol. 671 : Innovations in Non-Destructive Testing (SibTest 2015).— 2016.— [012003, 6 p.]
Corporate Author: Национальный исследовательский Томский политехнический университет (ТПУ) Институт неразрушающего контроля (ИНК) Кафедра точного приборостроения (ТПС)
Other Authors: Barbin E. S. Evgeny Sergeevich, Koleda A. N. Aleksey Nikolaevich, Nesterenko T. G. Tamara Georgievna, Vtorushin S.
Summary:Title screen
Microelectromechanical system accelerometers are widely used for metrological measurements of acceleration, tilt, vibration, and shock in moving objects. The paper presents the analysis of MEMS accelerometer that can be used for the structural inspection. ANSYS Multiphysics platform is used to simulate the behavior of MEMS accelerometer by employing a finite element model and MATLAB/Simulink tools for modeling nonlinear dynamic systems.
Режим доступа: по договору с организацией-держателем ресурса
Published: 2016
Subjects:
Online Access:http://dx.doi.org/10.1088/1742-6596/671/1/012003
http://earchive.tpu.ru/handle/11683/33744
Format: Electronic Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=647134
Description
Summary:Title screen
Microelectromechanical system accelerometers are widely used for metrological measurements of acceleration, tilt, vibration, and shock in moving objects. The paper presents the analysis of MEMS accelerometer that can be used for the structural inspection. ANSYS Multiphysics platform is used to simulate the behavior of MEMS accelerometer by employing a finite element model and MATLAB/Simulink tools for modeling nonlinear dynamic systems.
Режим доступа: по договору с организацией-держателем ресурса
DOI:10.1088/1742-6596/671/1/012003