Theoretical analysis of the strain mapping in a single core-shell nanowire by x-ray Bragg ptychography; Proceedings of SPIE; Vol. 9592 : X-Ray Nanoimaging: Instruments and Methods II

Theoretical analysis of the strain mapping in a single core-shell nanowire by x-ray Bragg ptychography; Proceedings of SPIE; Vol. 9592 : X-Ray Nanoimaging: Instruments and Methods II

গ্রন্থ-পঞ্জীর বিবরন
Parent link:	Proceedings of SPIE Vol. 9592 : X-Ray Nanoimaging: Instruments and Methods II.— 2015.— [95920S, 8 p.]
সংস্থা লেখক:	Национальный исследовательский Томский политехнический университет (ТПУ) Институт международного образования и языковой коммуникации (ИМОЯК) Кафедра междисциплинарная (МД)
অন্যান্য লেখক:	Dzhigaev D. Dmitry, Stankevic T. Tomas, Besedin I. Ilya, Lazarev S. V. Sergey Vladimirovich, Shabalin A. Anatoly, Strikhanov M. N. Mikhail Nikolaevich, FeidenhansI R. Robert, Vartanyants I. A. Ivan
সংক্ষিপ্ত:	Title screen X-ray Bragg ptychography (XBP) is an experimental technique for high-resolution strain mapping in a single nano- and mesoscopic crystalline structures. In this work we discuss the conditions that allow direct interpretation of the ptychographic reconstructions in terms of the strain distribution obtained from the two dimensional (2D) XBP. Simulations of the 2D XBP experiments under realistic experimental conditions are performed with a model of InGaN/GaN core-shell nanowire with low (1%) and high (30%) Indium concentrations in the shell. Режим доступа: по договору с организацией-держателем ресурса
ভাষা:	ইংরেজি
প্রকাশিত:	2015
বিষয়গুলি:	электронный ресурс труды учёных ТПУ ядро оболочки нанопроволоки
অনলাইন ব্যবহার করুন:	http://dx.doi.org/10.1117/12.2190416
বিন্যাস:	বৈদ্যুতিক গ্রন্থ
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=647063

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