Theoretical analysis of the strain mapping in a single core-shell nanowire by x-ray Bragg ptychography

Theoretical analysis of the strain mapping in a single core-shell nanowire by x-ray Bragg ptychography

Bibliographic Details
Parent link:	Proceedings of SPIE Vol. 9592 : X-Ray Nanoimaging: Instruments and Methods II.— 2015.— [95920S, 8 p.]
Corporate Author:	Национальный исследовательский Томский политехнический университет (ТПУ) Институт международного образования и языковой коммуникации (ИМОЯК) Кафедра междисциплинарная (МД)
Other Authors:	Dzhigaev D. Dmitry, Stankevic T. Tomas, Besedin I. Ilya, Lazarev S. V. Sergey Vladimirovich, Shabalin A. Anatoly, Strikhanov M. N. Mikhail Nikolaevich, FeidenhansI R. Robert, Vartanyants I. A. Ivan
Summary:	Title screen X-ray Bragg ptychography (XBP) is an experimental technique for high-resolution strain mapping in a single nano- and mesoscopic crystalline structures. In this work we discuss the conditions that allow direct interpretation of the ptychographic reconstructions in terms of the strain distribution obtained from the two dimensional (2D) XBP. Simulations of the 2D XBP experiments under realistic experimental conditions are performed with a model of InGaN/GaN core-shell nanowire with low (1%) and high (30%) Indium concentrations in the shell. Режим доступа: по договору с организацией-держателем ресурса
Published:	2015
Subjects:	электронный ресурс труды учёных ТПУ ядро оболочки нанопроволоки
Online Access:	http://dx.doi.org/10.1117/12.2190416
Format:	Electronic Book
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=647063

Internet

http://dx.doi.org/10.1117/12.2190416