Theoretical analysis of the strain mapping in a single core-shell nanowire by x-ray Bragg ptychography; Proceedings of SPIE; Vol. 9592 : X-Ray Nanoimaging: Instruments and Methods II
| Parent link: | Proceedings of SPIE Vol. 9592 : X-Ray Nanoimaging: Instruments and Methods II.— 2015.— [95920S, 8 p.] |
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| Korporativna značnica: | |
| Drugi avtorji: | , , , , , , , |
| Izvleček: | Title screen X-ray Bragg ptychography (XBP) is an experimental technique for high-resolution strain mapping in a single nano- and mesoscopic crystalline structures. In this work we discuss the conditions that allow direct interpretation of the ptychographic reconstructions in terms of the strain distribution obtained from the two dimensional (2D) XBP. Simulations of the 2D XBP experiments under realistic experimental conditions are performed with a model of InGaN/GaN core-shell nanowire with low (1%) and high (30%) Indium concentrations in the shell. Режим доступа: по договору с организацией-держателем ресурса |
| Jezik: | angleščina |
| Izdano: |
2015
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| Teme: | |
| Online dostop: | http://dx.doi.org/10.1117/12.2190416 |
| Format: | MixedMaterials Elektronski Knjiga |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=647063 |
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| 200 | 1 | |a Theoretical analysis of the strain mapping in a single core-shell nanowire by x-ray Bragg ptychography |f D. Dzhigaev [et al.] | |
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| 300 | |a Title screen | ||
| 320 | |a [References: 21 tit.] | ||
| 330 | |a X-ray Bragg ptychography (XBP) is an experimental technique for high-resolution strain mapping in a single nano- and mesoscopic crystalline structures. In this work we discuss the conditions that allow direct interpretation of the ptychographic reconstructions in terms of the strain distribution obtained from the two dimensional (2D) XBP. Simulations of the 2D XBP experiments under realistic experimental conditions are performed with a model of InGaN/GaN core-shell nanowire with low (1%) and high (30%) Indium concentrations in the shell. | ||
| 333 | |a Режим доступа: по договору с организацией-держателем ресурса | ||
| 461 | 1 | |0 (RuTPU)RU\TPU\network\12028 |t Proceedings of SPIE | |
| 463 | |t Vol. 9592 : X-Ray Nanoimaging: Instruments and Methods II |o San Diego, California, United States, August 09, 2015 |o [proceedings] |v [95920S, 8 p.] |d 2015 | ||
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