Optical and AFM studies on p-SNS thin films deposited by magnetron sputtering
| Parent link: | Chalcogenide Letters Vol. 12, iss. 9.— 2015.— [P. 483-487] |
|---|---|
| 主要作者: | An V. V. Vladimir Vilorievich |
| Corporate Authors: | Национальный исследовательский Томский политехнический университет (ТПУ) Институт физики высоких технологий (ИФВТ) Лаборатория № 12, Национальный исследовательский Томский политехнический университет |
| 其他作者: | Dronova M. V. Mariya Vladimirovna, Zakharov A. N. Aleksandr Nikolaevich |
| 總結: | Title screen Tin sulfide thin films were prepared by DC magnetron sputtering of a nanostructured SnS target in argon. The obtained samples were analyzed using atomic force microscopy (AFM), radio frequency glow discharge optical emission spectroscopy (RF-GD-OES) and UV-vis spectrophotometry. The thickness, roughness and surface porosity were evaluated using module software for AFM data visualization and analysis Gwyddion. A thin film growth mechanism was suggested based on the analysis of the AFM images. Режим доступа: по договору с организацией-держателем ресурса |
| 語言: | 英语 |
| 出版: |
2015
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| 主題: | |
| 在線閱讀: | http://elibrary.ru/item.asp?id=24960333 |
| 格式: | 電子 Book Chapter |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=645775 |
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