Optical and AFM studies on p-SNS thin films deposited by magnetron sputtering
| Parent link: | Chalcogenide Letters Vol. 12, iss. 9.— 2015.— [P. 483-487] |
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| Հիմնական հեղինակ: | |
| Համատեղ հեղինակներ: | , |
| Այլ հեղինակներ: | , |
| Ամփոփում: | Title screen Tin sulfide thin films were prepared by DC magnetron sputtering of a nanostructured SnS target in argon. The obtained samples were analyzed using atomic force microscopy (AFM), radio frequency glow discharge optical emission spectroscopy (RF-GD-OES) and UV-vis spectrophotometry. The thickness, roughness and surface porosity were evaluated using module software for AFM data visualization and analysis Gwyddion. A thin film growth mechanism was suggested based on the analysis of the AFM images. Режим доступа: по договору с организацией-держателем ресурса |
| Հրապարակվել է: |
2015
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| Խորագրեր: | |
| Առցանց հասանելիություն: | http://elibrary.ru/item.asp?id=24960333 |
| Ձևաչափ: | Էլեկտրոնային Գրքի գլուխ |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=645775 |
| Ամփոփում: | Title screen Tin sulfide thin films were prepared by DC magnetron sputtering of a nanostructured SnS target in argon. The obtained samples were analyzed using atomic force microscopy (AFM), radio frequency glow discharge optical emission spectroscopy (RF-GD-OES) and UV-vis spectrophotometry. The thickness, roughness and surface porosity were evaluated using module software for AFM data visualization and analysis Gwyddion. A thin film growth mechanism was suggested based on the analysis of the AFM images. Режим доступа: по договору с организацией-держателем ресурса |
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