Observation of spectral line splitting for parametric X-rays

Bibliographic Details
Parent link:	Physics Letters A: Scientific Journal Vol. 120, iss. 9.— 1987.— [P. 486–488]
Other Authors:	Adishchev Yu. N. Yuri Nikolaevich, Pleshkov G. A., Potylitsyn A. P. Alexander Petrovich, Uglov S. R. Sergey Romanovich, Vorobiev S. A. Sergey Aleksandrovich
Summary:	Title screen The spectral distribution and energy dependence of the yield of parametric X-rays for 200 to 900 MeV electrons transmitted through a silicon crystal have been measured. The measurements were performed in the Bragg geometry at an angle θ = 19° to the electron beam direction. The effect of spectral line splitting for parametric X-rays was observed. Режим доступа: по договору с организацией-держателем ресурса
Published:	1987
Subjects:	электронный ресурс труды учёных ТПУ
Online Access:	http://dx.doi.org/10.1016/0375-9601(87)90117-4
Format:	Electronic Book Chapter
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=644975

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