Национальный исследовательский Томский политехнический университет (ТПУ) Физико-технический институт (ФТИ) Кафедра общей физики (ОФ), Kuznetsov P. V. Pavel Viktorovich, Rakhmatulina T, Koznikov A, & Belyaeva I. (2015). Distribution Functions for Internal Interface Energy as a Characteristic of Submicrocrystalline Copper Structure Evolution under Low-Temperature Annealing; AIP Conference Proceedings; Vol. 1683: Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures. 2015. https://doi.org/10.1063/1.4932807
Chicago Style (17th ed.) CitationНациональный исследовательский Томский политехнический университет (ТПУ) Физико-технический институт (ФТИ) Кафедра общей физики (ОФ), Kuznetsov P. V. Pavel Viktorovich, Rakhmatulina T, Koznikov A, and Belyaeva I. Distribution Functions for Internal Interface Energy as a Characteristic of Submicrocrystalline Copper Structure Evolution Under Low-Temperature Annealing; AIP Conference Proceedings; Vol. 1683: Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures. 2015, 2015. https://doi.org/10.1063/1.4932807.
MLA (9th ed.) CitationНациональный исследовательский Томский политехнический университет (ТПУ) Физико-технический институт (ФТИ) Кафедра общей физики (ОФ), et al. Distribution Functions for Internal Interface Energy as a Characteristic of Submicrocrystalline Copper Structure Evolution Under Low-Temperature Annealing; AIP Conference Proceedings; Vol. 1683: Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures. 2015, 2015. https://doi.org/10.1063/1.4932807.