Detecting unit for X-ray nondestructive testing systems; Control and Communications (SIBCON)

מידע ביבליוגרפי
Parent link:Control and Communications (SIBCON).— 2015.— [2 p.]
מחבר ראשי: Nam I. F. Irina Feliksovna
מחבר תאגידי: Национальный исследовательский Томский политехнический университет (ТПУ) Институт неразрушающего контроля (ИНК) Кафедра промышленной и медицинской электроники (ПМЭ)
מחברים אחרים: Sakashev A. A. Amyr Aleksandrovich, Ryabkov S. A. Sergey Aleksandrovich
סיכום:Title screen
To provide an adequate X-ray detection efficiency is a real challenge to designers of digital radiographic systems for different applications, including medicine, biology, and nondestructive testing of materials and structural members. Analysis of the state-of-the art digital radiographic systems shows that the greatest body of information is obtained from imaging systems based on semiconductor X-ray detectors (Si, GaAs, Cd1-xZnxTe). Results of development of detecting unit for x-ray nondestructive testing systems are described in this paper.
Режим доступа: по договору с организацией-держателем ресурса
שפה:אנגלית
יצא לאור: 2015
נושאים:
גישה מקוונת:http://dx.doi.org/10.1109/SIBCON.2015.7147306
פורמט: MixedMaterials אלקטרוני Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=643991

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