Detecting unit for X-ray nondestructive testing systems; Control and Communications (SIBCON)
| Parent link: | Control and Communications (SIBCON).— 2015.— [2 p.] |
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| מחבר ראשי: | |
| מחבר תאגידי: | |
| מחברים אחרים: | , |
| סיכום: | Title screen To provide an adequate X-ray detection efficiency is a real challenge to designers of digital radiographic systems for different applications, including medicine, biology, and nondestructive testing of materials and structural members. Analysis of the state-of-the art digital radiographic systems shows that the greatest body of information is obtained from imaging systems based on semiconductor X-ray detectors (Si, GaAs, Cd1-xZnxTe). Results of development of detecting unit for x-ray nondestructive testing systems are described in this paper. Режим доступа: по договору с организацией-держателем ресурса |
| שפה: | אנגלית |
| יצא לאור: |
2015
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| נושאים: | |
| גישה מקוונת: | http://dx.doi.org/10.1109/SIBCON.2015.7147306 |
| פורמט: | אלקטרוני Book Chapter |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=643991 |