Detecting unit for X-ray nondestructive testing systems; Control and Communications (SIBCON)
| Parent link: | Control and Communications (SIBCON).— 2015.— [2 p.] |
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| Hlavní autor: | |
| Korporativní autor: | |
| Další autoři: | , |
| Shrnutí: | Title screen To provide an adequate X-ray detection efficiency is a real challenge to designers of digital radiographic systems for different applications, including medicine, biology, and nondestructive testing of materials and structural members. Analysis of the state-of-the art digital radiographic systems shows that the greatest body of information is obtained from imaging systems based on semiconductor X-ray detectors (Si, GaAs, Cd1-xZnxTe). Results of development of detecting unit for x-ray nondestructive testing systems are described in this paper. Режим доступа: по договору с организацией-держателем ресурса |
| Jazyk: | angličtina |
| Vydáno: |
2015
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| Témata: | |
| On-line přístup: | http://dx.doi.org/10.1109/SIBCON.2015.7147306 |
| Médium: | Elektronický zdroj Kapitola |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=643991 |
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| 200 | 1 | |a Detecting unit for X-ray nondestructive testing systems |f I. F. Nam, A. A. Sakashev, S. A. Ryabkov | |
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| 300 | |a Title screen | ||
| 320 | |a [References: 3 tit.] | ||
| 330 | |a To provide an adequate X-ray detection efficiency is a real challenge to designers of digital radiographic systems for different applications, including medicine, biology, and nondestructive testing of materials and structural members. Analysis of the state-of-the art digital radiographic systems shows that the greatest body of information is obtained from imaging systems based on semiconductor X-ray detectors (Si, GaAs, Cd1-xZnxTe). Results of development of detecting unit for x-ray nondestructive testing systems are described in this paper. | ||
| 333 | |a Режим доступа: по договору с организацией-держателем ресурса | ||
| 463 | |t Control and Communications (SIBCON) |o International Siberian Conference on Russia, Omsk, May 21-23, 2015 |v [2 p.] |o [proceedings] |d 2015 | ||
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 610 | 1 | |a detecting unit | |
| 610 | 1 | |a X-Ray | |
| 610 | 1 | |a nondestructive testing | |
| 700 | 1 | |a Nam |b I. F. |c specialist in the field of electrophysics |c Associate Professor of Tomsk Polytechnic University,candidate of technical sciences |f 1981- |g Irina Feliksovna |3 (RuTPU)RU\TPU\pers\33676 |9 17307 | |
| 701 | 1 | |a Sakashev |b A. A. |g Amyr Aleksandrovich | |
| 701 | 1 | |a Ryabkov |b S. A. |g Sergey Aleksandrovich | |
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