Detecting unit for X-ray nondestructive testing systems
| Parent link: | Control and Communications (SIBCON): International Siberian Conference on Russia, Omsk, May 21-23, 2015. [2 p.].— , 2015 |
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| Résumé: | Title screen To provide an adequate X-ray detection efficiency is a real challenge to designers of digital radiographic systems for different applications, including medicine, biology, and nondestructive testing of materials and structural members. Analysis of the state-of-the art digital radiographic systems shows that the greatest body of information is obtained from imaging systems based on semiconductor X-ray detectors (Si, GaAs, Cd1-xZnxTe). Results of development of detecting unit for x-ray nondestructive testing systems are described in this paper. Режим доступа: по договору с организацией-держателем ресурса |
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2015
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| Accès en ligne: | http://dx.doi.org/10.1109/SIBCON.2015.7147306 |
| Format: | Électronique Chapitre de livre |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=643991 |
| Résumé: | Title screen To provide an adequate X-ray detection efficiency is a real challenge to designers of digital radiographic systems for different applications, including medicine, biology, and nondestructive testing of materials and structural members. Analysis of the state-of-the art digital radiographic systems shows that the greatest body of information is obtained from imaging systems based on semiconductor X-ray detectors (Si, GaAs, Cd1-xZnxTe). Results of development of detecting unit for x-ray nondestructive testing systems are described in this paper. Режим доступа: по договору с организацией-держателем ресурса |
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| DOI: | 10.1109/SIBCON.2015.7147306 |