Research methods of reliability indicators of rectifier diode in tablet execution; European Physical Journal Web of Conferences (EPJ Web of Conferences); Vol. 82 : Thermophysical Basis of Energy Technologies
| Parent link: | European Physical Journal Web of Conferences (EPJ Web of Conferences) Vol. 82 : Thermophysical Basis of Energy Technologies.— 2015.— [01030, 4 р.] |
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| Summary: | Title screen A new forecast approach for the reliability of power semiconductor devices in cyclic operation on the basis of numerical analysis of nonuniform temperature fields is offered. We compared the failure rates of semiconductor power devices in real thermal regime with the thermal conductivity of the statistical data. |
| Sprog: | engelsk |
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2015
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| Online adgang: | http://dx.doi.org/10.1051/epjconf/20158201030 |
| Format: | Electronisk Book Chapter |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=643108 |