Research methods of reliability indicators of rectifier diode in tablet execution
| Parent link: | European Physical Journal Web of Conferences (EPJ Web of Conferences) Vol. 82 : Thermophysical Basis of Energy Technologies.— 2015.— [01030, 4 р.] |
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| Summary: | Title screen A new forecast approach for the reliability of power semiconductor devices in cyclic operation on the basis of numerical analysis of nonuniform temperature fields is offered. We compared the failure rates of semiconductor power devices in real thermal regime with the thermal conductivity of the statistical data. |
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2015
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| Online Access: | http://dx.doi.org/10.1051/epjconf/20158201030 |
| Format: | Electronic Book Chapter |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=643108 |
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| 200 | 1 | |a Research methods of reliability indicators of rectifier diode in tablet execution |f R. Kurmangaliev, E. V. Kravchenko | |
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| 300 | |a Title screen | ||
| 320 | |a [References: 7 tit.] | ||
| 330 | |a A new forecast approach for the reliability of power semiconductor devices in cyclic operation on the basis of numerical analysis of nonuniform temperature fields is offered. We compared the failure rates of semiconductor power devices in real thermal regime with the thermal conductivity of the statistical data. | ||
| 461 | 0 | |0 (RuTPU)RU\TPU\network\7958 |t European Physical Journal Web of Conferences (EPJ Web of Conferences) | |
| 463 | 0 | |0 (RuTPU)RU\TPU\network\7960 |t Vol. 82 : Thermophysical Basis of Energy Technologies |o Proceedings of the Conference, October 15-17, 2014, Tomsk, Russia |f National Research Tomsk Polytechnic University (TPU) ; eds. G. V. Kuznetsov [et al.] |v [01030, 4 р.] |d 2015 | |
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| 610 | 1 | |a выпрямительные диоды | |
| 610 | 1 | |a циклические режимы | |
| 610 | 1 | |a тепловые режимы | |
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| 700 | 1 | |a Kurmangaliev |b R. | |
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