APA (7th ed.) Citation

Chernyavski A. V. Aleksandr Viktorovich & Kaz M. S. (2015). Application of secondary ion mass spectrometer for measuring the diffusion profiles in alkali-halide crystals; IOP Conference Series: Materials Science and Engineering; Vol. 81 : Radiation-Thermal Effects and Processes in Inorganic Materials. 2015. https://doi.org/10.1088/1757-899X/81/1/012088

Chicago Style (17th ed.) Citation

Chernyavski A. V. Aleksandr Viktorovich and Kaz M. S. Application of Secondary Ion Mass Spectrometer for Measuring the Diffusion Profiles in Alkali-halide Crystals; IOP Conference Series: Materials Science and Engineering; Vol. 81 : Radiation-Thermal Effects and Processes in Inorganic Materials. 2015, 2015. https://doi.org/10.1088/1757-899X/81/1/012088.

MLA (9th ed.) Citation

Chernyavski A. V. Aleksandr Viktorovich and Kaz M. S. Application of Secondary Ion Mass Spectrometer for Measuring the Diffusion Profiles in Alkali-halide Crystals; IOP Conference Series: Materials Science and Engineering; Vol. 81 : Radiation-Thermal Effects and Processes in Inorganic Materials. 2015, 2015. https://doi.org/10.1088/1757-899X/81/1/012088.