Application of secondary ion mass spectrometer for measuring the diffusion profiles in alkali-halide crystals; IOP Conference Series: Materials Science and Engineering; Vol. 81 : Radiation-Thermal Effects and Processes in Inorganic Materials
| Parent link: | IOP Conference Series: Materials Science and Engineering Vol. 81 : Radiation-Thermal Effects and Processes in Inorganic Materials.— 2015.— [012088, 4 p.] |
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| Sumari: | Title screen Depth profiles of magnesium, fluorine and oxygen impurities was examined in the surface layers of alkali-halide KBr crystals using method of secondary ion mass spectrometry. Samples of potassium bromide, coated with a surface film of magnesium fluoride were subjected to isothermal diffusion annealing in air at various times. It is shown that the diffusion of O ions occurs from the ambient atmosphere besides the diffusion of Mg and F ions during annealing of KBr crystals. Accurate estimation of the diffusion coefficients of cationic impurity Mg requires taking into account the possible interaction of this impurity and oxygen. Режим доступа: по договору с организацией-держателем ресурса |
| Idioma: | anglès |
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2015
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| Accés en línia: | http://dx.doi.org/10.1088/1757-899X/81/1/012088 http://earchive.tpu.ru/handle/11683/14732 |
| Format: | Electrònic Capítol de llibre |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=643015 |