Application of secondary ion mass spectrometer for measuring the diffusion profiles in alkali-halide crystals
| Parent link: | IOP Conference Series: Materials Science and Engineering Vol. 81 : Radiation-Thermal Effects and Processes in Inorganic Materials.— 2015.— [012088, 4 p.] |
|---|---|
| Main Author: | |
| Corporate Author: | |
| Other Authors: | |
| Summary: | Title screen Depth profiles of magnesium, fluorine and oxygen impurities was examined in the surface layers of alkali-halide KBr crystals using method of secondary ion mass spectrometry. Samples of potassium bromide, coated with a surface film of magnesium fluoride were subjected to isothermal diffusion annealing in air at various times. It is shown that the diffusion of O ions occurs from the ambient atmosphere besides the diffusion of Mg and F ions during annealing of KBr crystals. Accurate estimation of the diffusion coefficients of cationic impurity Mg requires taking into account the possible interaction of this impurity and oxygen. Режим доступа: по договору с организацией-держателем ресурса |
| Published: |
2015
|
| Subjects: | |
| Online Access: | http://dx.doi.org/10.1088/1757-899X/81/1/012088 http://earchive.tpu.ru/handle/11683/14732 |
| Format: | Electronic Book Chapter |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=643015 |