Mechanisms of stress generation and relaxation in thin films and coatings; AIP Conference Proceedings; Vol. 1623 : International Conference on Physical Mesomechanics of Multilevel Systems 2014, Tomsk, Russia, 3–5 September 2014

Bibliografski detalji
Parent link:AIP Conference Proceedings
Vol. 1623 : International Conference on Physical Mesomechanics of Multilevel Systems 2014, Tomsk, Russia, 3–5 September 2014.— 2014.— [P. 575-578]
Glavni autor: Shugurov A. R. Artur Rubinovich
Daljnji autori: Panin A. V. Alexey Viktorovich
Sažetak:Title screen
The failure modes of thin metal films and ceramic coatings induced by both intrinsic (growth) stresses and external effects (uniaxial tension, alternating bending, thermal treatment) were studied. Stress relaxation that causes soft films and hard coatings to fail was demonstrated to be governed by essentially the same mechanisms. The primary factor governing the reliability of thin-film structures was shown to be the strength of the film/substrate interface.
Jezik:engleski
Izdano: 2014
Teme:
Online pristup:http://dx.doi.org/10.1063/1.4899010
http://earchive.tpu.ru/handle/11683/35754
Format: Elektronički Poglavlje knjige
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=641935

Slični predmeti