Mechanisms of stress generation and relaxation in thin films and coatings

Bibliographic Details
Parent link:AIP Conference Proceedings
Vol. 1623 : International Conference on Physical Mesomechanics of Multilevel Systems 2014, Tomsk, Russia, 3–5 September 2014.— 2014.— [P. 575-578]
Main Author: Shugurov A. R. Artur Rubinovich
Other Authors: Panin A. V. Alexey Viktorovich
Summary:Title screen
The failure modes of thin metal films and ceramic coatings induced by both intrinsic (growth) stresses and external effects (uniaxial tension, alternating bending, thermal treatment) were studied. Stress relaxation that causes soft films and hard coatings to fail was demonstrated to be governed by essentially the same mechanisms. The primary factor governing the reliability of thin-film structures was shown to be the strength of the film/substrate interface.
Published: 2014
Subjects:
Online Access:http://dx.doi.org/10.1063/1.4899010
http://earchive.tpu.ru/handle/11683/35754
Format: Electronic Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=641935