Mechanisms of stress generation and relaxation in thin films and coatings; AIP Conference Proceedings; Vol. 1623 : International Conference on Physical Mesomechanics of Multilevel Systems 2014, Tomsk, Russia, 3–5 September 2014
| Parent link: | AIP Conference Proceedings Vol. 1623 : International Conference on Physical Mesomechanics of Multilevel Systems 2014, Tomsk, Russia, 3–5 September 2014.— 2014.— [P. 575-578] |
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| Resumo: | Title screen The failure modes of thin metal films and ceramic coatings induced by both intrinsic (growth) stresses and external effects (uniaxial tension, alternating bending, thermal treatment) were studied. Stress relaxation that causes soft films and hard coatings to fail was demonstrated to be governed by essentially the same mechanisms. The primary factor governing the reliability of thin-film structures was shown to be the strength of the film/substrate interface. |
| Idioma: | inglês |
| Publicado em: |
2014
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| Acesso em linha: | http://dx.doi.org/10.1063/1.4899010 http://earchive.tpu.ru/handle/11683/35754 |
| Formato: | Recurso Eletrônico Capítulo de Livro |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=641935 |
MARC
| LEADER | 00000naa2a2200000 4500 | ||
|---|---|---|---|
| 001 | 641935 | ||
| 005 | 20251206120253.0 | ||
| 035 | |a (RuTPU)RU\TPU\network\6866 | ||
| 035 | |a RU\TPU\network\6862 | ||
| 090 | |a 641935 | ||
| 100 | |a 20150609d2014 k||y0engy50 ba | ||
| 101 | 0 | |a eng | |
| 102 | |a US | ||
| 135 | |a drcn ---uucaa | ||
| 181 | 0 | |a i | |
| 182 | 0 | |a b | |
| 200 | 1 | |a Mechanisms of stress generation and relaxation in thin films and coatings |f A. R. Shugurov, A. V. Panin | |
| 203 | |a Text |c electronic | ||
| 300 | |a Title screen | ||
| 320 | |a [References: p. 578 (10 tit.)] | ||
| 330 | |a The failure modes of thin metal films and ceramic coatings induced by both intrinsic (growth) stresses and external effects (uniaxial tension, alternating bending, thermal treatment) were studied. Stress relaxation that causes soft films and hard coatings to fail was demonstrated to be governed by essentially the same mechanisms. The primary factor governing the reliability of thin-film structures was shown to be the strength of the film/substrate interface. | ||
| 461 | 0 | |0 (RuTPU)RU\TPU\network\4816 |t AIP Conference Proceedings | |
| 463 | 0 | |0 (RuTPU)RU\TPU\network\4814 |t Vol. 1623 : International Conference on Physical Mesomechanics of Multilevel Systems 2014, Tomsk, Russia, 3–5 September 2014 |o [proceedings] |f National Research Tomsk Polytechnic University (TPU) |v [P. 575-578] |d 2014 | |
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 610 | 1 | |a генерация | |
| 610 | 1 | |a релаксация | |
| 610 | 1 | |a покрытия | |
| 610 | 1 | |a тонкие пленки | |
| 610 | 1 | |a металлические пленки | |
| 610 | 1 | |a керамические покрытия | |
| 610 | 1 | |a тонкопленочные структуры | |
| 700 | 1 | |a Shugurov |b A. R. |c Specialist in the field of material science |c Professor of Tomsk Polytechnic University, Doctor of Physical and Mathematical Sciences |f 1967- |g Artur Rubinovich |y Tomsk |9 22641 | |
| 701 | 1 | |a Panin |b A. V. |c physicist |c Professor of Tomsk Polytechnic University, doctor of physical and mathematical Sciences |f 1971- |g Alexey Viktorovich |3 (RuTPU)RU\TPU\pers\34630 |9 17992 | |
| 801 | 2 | |a RU |b 63413507 |c 20170109 |g RCR | |
| 856 | 4 | |u http://dx.doi.org/10.1063/1.4899010 |z http://dx.doi.org/10.1063/1.4899010 | |
| 856 | 4 | |u http://earchive.tpu.ru/handle/11683/35754 |z http://earchive.tpu.ru/handle/11683/35754 | |
| 942 | |c CF | ||