Temperature dependence of the dielectric strength of zinc sulfide films; Russian Physics Journal; Vol. 39, iss. 6
| Parent link: | Russian Physics Journal.— , 1965- Vol. 39, iss. 6.— 1996.— [P. 576-578] |
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| Altres autors: | , , , , |
| Sumari: | Title screen The temperature dependence of the dielectric strength Epn of ZnS:Mn films produced by high-frequency magnetron sputtering was investigated in the range T=20–200°C. It is shown that processes associated with removal of adsorbed water from the ZnS:Mn films are responsible for the maximum on the Epn=f(T) curve. Data on the temperature dependence of the capacitance and loss-angle are given for thin-film systems based on ZnS:Mn. Режим доступа: по договору с организацией-держателем ресурса |
| Idioma: | anglès |
| Publicat: |
1996
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| Matèries: | |
| Accés en línia: | http://dx.doi.org/10.1007/BF02437024 |
| Format: | Electrònic Capítol de llibre |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=641074 |
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| 200 | 1 | |a Temperature dependence of the dielectric strength of zinc sulfide films |f A. A. Zhigal'skii [et al.] | |
| 203 | |a Text |c electronic | ||
| 300 | |a Title screen | ||
| 320 | |a [References: p. 578 (7 tit.)] | ||
| 330 | |a The temperature dependence of the dielectric strength Epn of ZnS:Mn films produced by high-frequency magnetron sputtering was investigated in the range T=20–200°C. It is shown that processes associated with removal of adsorbed water from the ZnS:Mn films are responsible for the maximum on the Epn=f(T) curve. Data on the temperature dependence of the capacitance and loss-angle are given for thin-film systems based on ZnS:Mn. | ||
| 333 | |a Режим доступа: по договору с организацией-держателем ресурса | ||
| 461 | |t Russian Physics Journal |d 1965- | ||
| 463 | |t Vol. 39, iss. 6 |v [P. 576-578] |d 1996 | ||
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