Temperature dependence of the dielectric strength of zinc sulfide films

Bibliographic Details
Parent link:	Russian Physics Journal.— , 1965- Vol. 39, iss. 6.— 1996.— [P. 576-578]
Other Authors:	Zhigal'skii A. A., Ikonnikova L. F. Liubov Fedorovna, Minakova T. S., Mukhachev V. A., Troyan P. E.
Summary:	Title screen The temperature dependence of the dielectric strength Epn of ZnS:Mn films produced by high-frequency magnetron sputtering was investigated in the range T=20–200°C. It is shown that processes associated with removal of adsorbed water from the ZnS:Mn films are responsible for the maximum on the Epn=f(T) curve. Data on the temperature dependence of the capacitance and loss-angle are given for thin-film systems based on ZnS:Mn. Режим доступа: по договору с организацией-держателем ресурса
Language:	English
Published:	1996
Subjects:	электронный ресурс труды учёных ТПУ
Online Access:	http://dx.doi.org/10.1007/BF02437024
Format:	Electronic Book Chapter
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=641074

Internet

http://dx.doi.org/10.1007/BF02437024