Temperature dependence of the dielectric strength of zinc sulfide films
| Parent link: | Russian Physics Journal.— , 1965- Vol. 39, iss. 6.— 1996.— [P. 576-578] |
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| Other Authors: | , , , , |
| Summary: | Title screen The temperature dependence of the dielectric strength Epn of ZnS:Mn films produced by high-frequency magnetron sputtering was investigated in the range T=20–200°C. It is shown that processes associated with removal of adsorbed water from the ZnS:Mn films are responsible for the maximum on the Epn=f(T) curve. Data on the temperature dependence of the capacitance and loss-angle are given for thin-film systems based on ZnS:Mn. Режим доступа: по договору с организацией-держателем ресурса |
| Language: | English |
| Published: |
1996
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| Subjects: | |
| Online Access: | http://dx.doi.org/10.1007/BF02437024 |
| Format: | Electronic Book Chapter |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=641074 |
| Summary: | Title screen The temperature dependence of the dielectric strength Epn of ZnS:Mn films produced by high-frequency magnetron sputtering was investigated in the range T=20–200°C. It is shown that processes associated with removal of adsorbed water from the ZnS:Mn films are responsible for the maximum on the Epn=f(T) curve. Data on the temperature dependence of the capacitance and loss-angle are given for thin-film systems based on ZnS:Mn. Режим доступа: по договору с организацией-держателем ресурса |
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| DOI: | 10.1007/BF02437024 |