The reliability of the power semiconductor module on the operating temperature; MATEC Web of Conferences; Vol. 19 : The 2nd International Youth Forum “Smart Grids”, Tomsk, Russia, October 6-10, 2014
| Parent link: | MATEC Web of Conferences Vol. 19 : The 2nd International Youth Forum “Smart Grids”, Tomsk, Russia, October 6-10, 2014.— 2014.— [01002, 6 p.] |
|---|---|
| Main Author: | |
| Corporate Author: | |
| Other Authors: | |
| Summary: | Title screen A comparison of the intensities of the failure of a power unit with the real thermal regime of the device under conditions of natural convection and obtained by using statistical data analysis. The integrated assessment of reliability based on the methods of physics failures. The necessity of taking into account the actual non-stationary temperature fields to improve the reliability of the forecast operating life of power semiconductor devices. |
| Language: | English |
| Published: |
2014
|
| Subjects: | |
| Online Access: | http://dx.doi.org/10.1051/matecconf/20141901002 |
| Format: | Electronic Book Chapter |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=640089 |
MARC
| LEADER | 00000nla2a2200000 4500 | ||
|---|---|---|---|
| 001 | 640089 | ||
| 005 | 20240220133645.0 | ||
| 035 | |a (RuTPU)RU\TPU\network\4619 | ||
| 035 | |a RU\TPU\network\3158 | ||
| 090 | |a 640089 | ||
| 100 | |a 20150409a2014 k y0engy50 ba | ||
| 101 | 0 | |a eng | |
| 102 | |a FR | ||
| 105 | |a y z 100zy | ||
| 135 | |a drcn ---uucaa | ||
| 181 | 0 | |a i | |
| 182 | 0 | |a b | |
| 200 | 1 | |a The reliability of the power semiconductor module on the operating temperature |f E. V. Kravchenko, D. Yu. Ivleva | |
| 203 | |a Text |c electronic | ||
| 300 | |a Title screen | ||
| 320 | |a [References: 31 tit.] | ||
| 330 | |a A comparison of the intensities of the failure of a power unit with the real thermal regime of the device under conditions of natural convection and obtained by using statistical data analysis. The integrated assessment of reliability based on the methods of physics failures. The necessity of taking into account the actual non-stationary temperature fields to improve the reliability of the forecast operating life of power semiconductor devices. | ||
| 461 | 0 | |0 (RuTPU)RU\TPU\network\4526 |t MATEC Web of Conferences | |
| 463 | 0 | |0 (RuTPU)RU\TPU\network\4524 |t Vol. 19 : The 2nd International Youth Forum “Smart Grids”, Tomsk, Russia, October 6-10, 2014 |o [proceedings] |f National Research Tomsk Polytechnic University (TPU) |v [01002, 6 p.] |d 2014 | |
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 610 | 1 | |a надежность | |
| 610 | 1 | |a силовые модули | |
| 610 | 1 | |a полупроводниковые модули | |
| 610 | 1 | |a температура | |
| 610 | 1 | |a питание | |
| 610 | 1 | |a тепловые режимы | |
| 610 | 1 | |a силовые приборы | |
| 610 | 1 | |a полупроводниковые приборы | |
| 610 | 1 | |a блоки | |
| 700 | 1 | |a Kravchenko |b E. V. |c specialist in the field of power engineering |c Associate Professor of Tomsk Polytechnic University, Candidate of technical sciences |f 1981- |g Evgeny Vladimirovich |3 (RuTPU)RU\TPU\pers\32852 |9 16700 | |
| 701 | 1 | |a Ivleva |b D. Yu. | |
| 712 | 0 | 2 | |a Национальный исследовательский Томский политехнический университет (ТПУ) |b Энергетический институт (ЭНИН) |b Кафедра автоматизации теплоэнергетических процессов (АТП) |3 (RuTPU)RU\TPU\col\18678 |
| 801 | 2 | |a RU |b 63413507 |c 20161226 |g RCR | |
| 856 | 4 | |u http://dx.doi.org/10.1051/matecconf/20141901002 | |
| 942 | |c CF | ||