Kravchenko E. V. Evgeny Vladimirovich & Ivleva D. Yu. (2014). The reliability of the power semiconductor module on the operating temperature; MATEC Web of Conferences; Vol. 19: The 2nd International Youth Forum “Smart Grids”, Tomsk, Russia, October 6-10, 2014. 2014. https://doi.org/10.1051/matecconf/20141901002
Cita Chicago Style (17a ed.)Kravchenko E. V. Evgeny Vladimirovich y Ivleva D. Yu. The Reliability of the Power Semiconductor Module on the Operating Temperature; MATEC Web of Conferences; Vol. 19: The 2nd International Youth Forum “Smart Grids”, Tomsk, Russia, October 6-10, 2014. 2014, 2014. https://doi.org/10.1051/matecconf/20141901002.
Cita MLA (9a ed.)Kravchenko E. V. Evgeny Vladimirovich y Ivleva D. Yu. The Reliability of the Power Semiconductor Module on the Operating Temperature; MATEC Web of Conferences; Vol. 19: The 2nd International Youth Forum “Smart Grids”, Tomsk, Russia, October 6-10, 2014. 2014, 2014. https://doi.org/10.1051/matecconf/20141901002.