Dyfyniad APA

Kravchenko E. V. Evgeny Vladimirovich & Ivleva D. Yu. (2014). The reliability of the power semiconductor module on the operating temperature; MATEC Web of Conferences; Vol. 19: The 2nd International Youth Forum “Smart Grids”, Tomsk, Russia, October 6-10, 2014. 2014. https://doi.org/10.1051/matecconf/20141901002

Dyfyniad Arddull Chicago

Kravchenko E. V. Evgeny Vladimirovich and Ivleva D. Yu. The Reliability of the Power Semiconductor Module on the Operating Temperature; MATEC Web of Conferences; Vol. 19: The 2nd International Youth Forum “Smart Grids”, Tomsk, Russia, October 6-10, 2014. 2014, 2014. https://doi.org/10.1051/matecconf/20141901002.

Dyfyniad MLA

Kravchenko E. V. Evgeny Vladimirovich and Ivleva D. Yu. The Reliability of the Power Semiconductor Module on the Operating Temperature; MATEC Web of Conferences; Vol. 19: The 2nd International Youth Forum “Smart Grids”, Tomsk, Russia, October 6-10, 2014. 2014, 2014. https://doi.org/10.1051/matecconf/20141901002.

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