APA (7th ed.) Citation

Kravchenko E. V. Evgeny Vladimirovich & Ivleva D. Yu. (2014). The reliability of the power semiconductor module on the operating temperature; MATEC Web of Conferences; Vol. 19: The 2nd International Youth Forum “Smart Grids”, Tomsk, Russia, October 6-10, 2014. 2014. https://doi.org/10.1051/matecconf/20141901002

Chicago Style (17th ed.) Citation

Kravchenko E. V. Evgeny Vladimirovich and Ivleva D. Yu. The Reliability of the Power Semiconductor Module on the Operating Temperature; MATEC Web of Conferences; Vol. 19: The 2nd International Youth Forum “Smart Grids”, Tomsk, Russia, October 6-10, 2014. 2014, 2014. https://doi.org/10.1051/matecconf/20141901002.

MLA (9th ed.) Citation

Kravchenko E. V. Evgeny Vladimirovich and Ivleva D. Yu. The Reliability of the Power Semiconductor Module on the Operating Temperature; MATEC Web of Conferences; Vol. 19: The 2nd International Youth Forum “Smart Grids”, Tomsk, Russia, October 6-10, 2014. 2014, 2014. https://doi.org/10.1051/matecconf/20141901002.