Bias-assisted magnetron sputtering of yttria-stabilised zirconia thin films

Bibliographic Details
Parent link:Journal of Physics: Conference Series
Vol. 552 : International Congress on Energy Fluxes and Radiation Effects (EFRE-2014), 21–26 September 2014, Tomsk, Russia.— 2014.— [ 012010, 6 p.]
Corporate Author: Национальный исследовательский Томский политехнический университет (ТПУ) Физико-технический институт (ФТИ) Кафедра водородной энергетики и плазменных технологий (ВЭПТ)
Other Authors: Soloviev A. A. Andrey Aleksandrovich, Rabotkin S. V., Ionov I. V. Igor Vyacheslavovich, Shipilova A. V. Anna Viktorovna, Kovalchuk A. N. Anastasia Nikolaevna, Borduleva A. O. Alena Olegovna
Summary:Title screen
Cubic yttria-stabilized zirconia (YSZ) thin films were deposited by reactive magnetron sputtering on NiO-YSZ fuel cell anodes under different conditions. The influence of substrate bias voltage, temperature and porosity on texture and morphology of the deposited films were investigated. Comparing film morphology of YSZ grown on NiO-YSZ anodes, it was found that films deposited on a substrate with a large porosity were columnar and contained voids regardless of the deposition parameters. It was shown that only using of anode support with very high surface quality, substrate heating up to 500 °C and pulsed substrate bias (about -30 V MF) during film deposition is necessary for deposition of non-columnar thin films without voids and cracks that may be suitable for SOFC application.
Режим доступа: по договору с организацией-держателем ресурса
Published: 2014
Subjects:
Online Access:http://iopscience.iop.org/1742-6596/552/1/012010
Format: Electronic Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=639135