Parametric x radiation from thick crystals

Dettagli Bibliografici
Parent link:	Physical Review E: Scientific Journal Vol. 51, Iss. 6.— 1995.— [P. 6305- 6308]
Altri autori:	Endo I., Harada M., Kobayashi T., Lee Y. S., Ohgaki T., Takahashi T., Muto M., Yoshida K., Nitta H., Ohba Т., Zabaev V. N. Viktor Nikolaevich, Potylitsyn A. P. Alexander Petrovich
Riassunto:	Title screen The parametric x radiation from thick Si single crystals with 0.5–5 mm thickness was investigated at an electron energy of 900 MeV. As the crystal thickness increased, both intensity and angular spread reached a plateau after their increase in the thin crystal region, resulting in more brilliant x rays than Feranchuk and Ivashin’s prediction [J. Phys. (Paris) 46, 1981 (1985)] for thick crystals. This behavior is consistent with the incoherent model proposed in our previous paper [Phys. Rev. Lett. 70, 3247 (1993)] Режим доступа: по договору с организацией-держателем ресурса
Pubblicazione:	1995
Soggetti:	электронный ресурс труды учёных ТПУ
Accesso online:	http://dx.doi.org/10.1103/PhysRevE.51.6305
Natura:	Elettronico Capitolo di libro
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=636812

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