Soft x-ray radiation on the microtron electron beam

Detaylı Bibliyografya
Parent link:The 7th International Forum on Strategic Technology (IFOST-2012), September 18-21, 2012, Tomsk: [proceedings]/ National Research Tomsk Polytechnic University (TPU). [3 p.].— , 2012
Yazar: Uglov S. R. Sergey Romanovich
Diğer Yazarlar: Zabaev V. N. Viktor Nikolaevich, Kuznetsov S. I. Sergey Ivanovich
Özet:Title screen
The first results of experimental study of a back transition radiation (BTR) generated by 5.7 MeV electrons in the soft x-ray radiation region are presented. In the experiment the angular distribution (rocking curves) of the yield of radiation generated at the input surfaces of the samples has been measured for thin Si crystal. The radiation was measured by a channel electron multiplier (CEM-6) at the angle θD = 60° with respect to the electron beam direction. The experimental results and the method of extraction of the DTR and PXR contributions are discussed and are compared with the theory. For estimation of the radiation energy structure and the background level are used super thin filters. The analysis of the results testified, that main contributions in the radiation yield depend from the 10-30 eV photons emission.
Режим доступа: по договору с организацией-держателем ресурса
Dil:İngilizce
Baskı/Yayın Bilgisi: 2012
Konular:
Online Erişim:http://dx.doi.org/10.1109/IFOST.2012.6357778
Materyal Türü: Elektronik Kitap Bölümü
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=636769

MARC

LEADER 00000nla2a2200000 4500
001 636769
005 20231214160527.0
035 |a (RuTPU)RU\TPU\network\823 
090 |a 636769 
100 |a 20140320a2012 k y0engy50 ba 
101 0 |a eng 
105 |a y z 100zy 
135 |a drnn ---uucaa 
181 0 |a i  
182 0 |a b 
200 1 |a Soft x-ray radiation on the microtron electron beam  |f S. R. Uglov, V. N. Zabaev, S. I. Kuznetsov 
203 |a Text  |c electronic 
300 |a Title screen 
320 |a [References: 6 tit.] 
330 |a The first results of experimental study of a back transition radiation (BTR) generated by 5.7 MeV electrons in the soft x-ray radiation region are presented. In the experiment the angular distribution (rocking curves) of the yield of radiation generated at the input surfaces of the samples has been measured for thin Si crystal. The radiation was measured by a channel electron multiplier (CEM-6) at the angle θD = 60° with respect to the electron beam direction. The experimental results and the method of extraction of the DTR and PXR contributions are discussed and are compared with the theory. For estimation of the radiation energy structure and the background level are used super thin filters. The analysis of the results testified, that main contributions in the radiation yield depend from the 10-30 eV photons emission. 
333 |a Режим доступа: по договору с организацией-держателем ресурса 
463 0 |0 (RuTPU)RU\TPU\network\10411  |t The 7th International Forum on Strategic Technology (IFOST-2012), September 18-21, 2012, Tomsk  |o [proceedings]  |f National Research Tomsk Polytechnic University (TPU)  |v [3 p.]  |d 2012 
610 1 |a труды учёных ТПУ 
610 1 |a электронный ресурс 
610 1 |a электроны 
610 1 |a electrons 
610 1 |a electromagnetic radiation 
610 1 |a электромагнитное излучение 
610 1 |a surfaces 
610 1 |a поверхности 
610 1 |a microtron 
610 1 |a микротроны 
610 1 |a synchrotron radiation 
610 1 |a синхротронное излучение 
700 1 |a Uglov  |b S. R.  |c physicist  |c Leading Researcher of Tomsk Polytechnic University, Candidate of Physical and Mathematical Sciences  |f 1958-  |g Sergey Romanovich  |3 (RuTPU)RU\TPU\pers\31533  |9 15694 
701 1 |a Zabaev  |b V. N.  |c physicist  |c associate professor of Tomsk Polytechnic University  |f 1946-  |g Viktor Nikolaevich  |3 (RuTPU)RU\TPU\pers\31534 
701 1 |a Kuznetsov  |b S. I.  |c physicist  |c associate professor of Tomsk polytechnic university, candidate of technical sciences (PhD)  |f 1952-  |g Sergey Ivanovich  |3 (RuTPU)RU\TPU\pers\30071 
801 1 |a RU  |b 63413507  |c 20130228 
801 2 |a RU  |b 63413507  |c 20151216  |g RCR 
856 4 |u http://dx.doi.org/10.1109/IFOST.2012.6357778 
942 |c CF