Soft x-ray radiation on the microtron electron beam; The 7th International Forum on Strategic Technology (IFOST-2012), September 18-21, 2012, Tomsk
| Parent link: | The 7th International Forum on Strategic Technology (IFOST-2012), September 18-21, 2012, Tomsk.— 2012.— [3 p.] |
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| Hlavní autor: | |
| Další autoři: | , |
| Shrnutí: | Title screen The first results of experimental study of a back transition radiation (BTR) generated by 5.7 MeV electrons in the soft x-ray radiation region are presented. In the experiment the angular distribution (rocking curves) of the yield of radiation generated at the input surfaces of the samples has been measured for thin Si crystal. The radiation was measured by a channel electron multiplier (CEM-6) at the angle θD = 60° with respect to the electron beam direction. The experimental results and the method of extraction of the DTR and PXR contributions are discussed and are compared with the theory. For estimation of the radiation energy structure and the background level are used super thin filters. The analysis of the results testified, that main contributions in the radiation yield depend from the 10-30 eV photons emission. Режим доступа: по договору с организацией-держателем ресурса |
| Jazyk: | angličtina |
| Vydáno: |
2012
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| Témata: | |
| On-line přístup: | http://dx.doi.org/10.1109/IFOST.2012.6357778 |
| Médium: | Elektronický zdroj Kapitola |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=636769 |