Dynamics of the Thermal Instability Evolution in Dielectric Breakdown
| Parent link: | Russian Physics Journal: Scientific Journal Vol. 44, iss. 1.— 2001.— [P. 48-54] |
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| Hlavní autor: | |
| Další autoři: | , |
| Shrnutí: | Title screen A mathematical model of the dynamics of temperature, electric field strength, and charge density in thermal dielectric breakdown is examined. The characteristics of the evolution of a thermal instability initiated by a local temperature disturbance are studied by numerical modeling. The conditions of initiation and growth of an electrothermal structure resulting in the formation of a highly conductive channel and shunting of the dielectrics current are identified Режим доступа: по договору с организацией-держателем ресурса |
| Jazyk: | angličtina |
| Vydáno: |
2001
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| Témata: | |
| On-line přístup: | http://link.springer.com/article/10.1023/A:1011308702072 |
| Médium: | Elektronický zdroj Kapitola |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=636548 |