Dynamics of the Thermal Instability Evolution in Dielectric Breakdown

Podrobná bibliografie
Parent link:Russian Physics Journal: Scientific Journal
Vol. 44, iss. 1.— 2001.— [P. 48-54]
Hlavní autor: Noskov M. D. Mikhail Dmitrievich
Další autoři: Cheglokov A. A., Shapovalov A. V. Aleksandr Vasilyevich
Shrnutí:Title screen
A mathematical model of the dynamics of temperature, electric field strength, and charge density in thermal dielectric breakdown is examined. The characteristics of the evolution of a thermal instability initiated by a local temperature disturbance are studied by numerical modeling. The conditions of initiation and growth of an electrothermal structure resulting in the formation of a highly conductive channel and shunting of the dielectrics current are identified
Режим доступа: по договору с организацией-держателем ресурса
Jazyk:angličtina
Vydáno: 2001
Témata:
On-line přístup:http://link.springer.com/article/10.1023/A:1011308702072
Médium: Elektronický zdroj Kapitola
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=636548