Soft Component of Emission from Channeled Electrons in a Silicon Crystal

Soft Component of Emission from Channeled Electrons in a Silicon Crystal

Podrobná bibliografie
Parent link:Russian Physics Journal
Vol. 44, iss. 3.— 2001.— [P. 281-291]
Další autoři: Vnukov I. E., Kalinin B. N., Kiryakov A. A., Naumenko G. A. Gennadiy Andreevich, Padalko D. V., Potylitsyn A. P. Alexander Petrovich
Shrnutí:Title screen
The Tomsk synchrotron has been used to measure the emission spectrum and orientation dependences of the yield of photons with energies much smaller than the emission energy of channeled electrons. The measurements have been performed with a crystal-diffraction spectrometer. For electrons incident along the (110) axis, the radiation intensity in the energy range 30 ≤ ω ≤ 360 keV exceeds the bremsstrahlung one by almost an order of magnitude. The shape of the emission spectrum does not coincide with that of the bremsstrahlung spectrum. The radiation intensity increases smoothly with the photon energy. The bremsstrahlung spectrum from a disoriented crystalline target is satisfactorily described by the existing theory with phenomenological consideration of the polarization of the medium
Режим доступа: по договору с организацией-держателем ресурса
Vydáno: 2001
Témata:
электронный ресурс
труды учёных ТПУ
crystals
emission
On-line přístup:http://link.springer.com/article/10.1023/A:1011348120730
Médium: Elektronický zdroj Kapitola
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=636365

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