Soft Component of Emission from Channeled Electrons in a Silicon Crystal
| Parent link: | Russian Physics Journal Vol. 44, iss. 3.— 2001.— [P. 281-291] |
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| Kolejni autorzy: | , , , , , |
| Streszczenie: | Title screen The Tomsk synchrotron has been used to measure the emission spectrum and orientation dependences of the yield of photons with energies much smaller than the emission energy of channeled electrons. The measurements have been performed with a crystal-diffraction spectrometer. For electrons incident along the (110) axis, the radiation intensity in the energy range 30 ≤ ω ≤ 360 keV exceeds the bremsstrahlung one by almost an order of magnitude. The shape of the emission spectrum does not coincide with that of the bremsstrahlung spectrum. The radiation intensity increases smoothly with the photon energy. The bremsstrahlung spectrum from a disoriented crystalline target is satisfactorily described by the existing theory with phenomenological consideration of the polarization of the medium Режим доступа: по договору с организацией-держателем ресурса |
| Język: | angielski |
| Wydane: |
2001
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| Hasła przedmiotowe: | |
| Dostęp online: | http://link.springer.com/article/10.1023/A:1011348120730 |
| Format: | Elektroniczne Rozdział |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=636365 |