Анализ электрических характеристик датчика термоэлектрического дефектоскопа; Современные технологии, экономика и образование
| Parent link: | Современные технологии, экономика и образование.— 2019.— [С. 17-19] |
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| Andre forfattere: | , |
| Summary: | Заглавие с титульного экрана The article presents a method for calculating the equivalent source of thermal EMF for thermoelectric nondestructive testing devices. The calculation is based on the use of the source superposition method, which makes it possible to obtain the calculated ratios in an optimal way. |
| Sprog: | russisk |
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2019
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| Serier: | Измерительные системы и автоматизация систем управления |
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| Online adgang: | http://earchive.tpu.ru/handle/11683/58183 |
| Format: | Electronisk Book Chapter |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=630979 |
| Summary: | Заглавие с титульного экрана The article presents a method for calculating the equivalent source of thermal EMF for thermoelectric nondestructive testing devices. The calculation is based on the use of the source superposition method, which makes it possible to obtain the calculated ratios in an optimal way. |
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