Measurement of Wide-Aperture X-ray Beam Trasverse Proﬁle Based on Multiangular Wire Scanning; Radiation from Relativistic Electrons in Periodic Structures (RREPS-19)

Measurement of Wide-Aperture X-ray Beam Trasverse Proﬁle Based on Multiangular Wire Scanning; Radiation from Relativistic Electrons in Periodic Structures (RREPS-19)

Detalles Bibliográficos
Parent link:	Radiation from Relativistic Electrons in Periodic Structures (RREPS-19).— 2019.— [P. 130]
Corporate Authors:	Национальный исследовательский Томский политехнический университет Исследовательская школа физики высокоэнергетических процессов, Национальный исследовательский Томский политехнический университет Инженерная школа ядерных технологий Отделение ядерно-топливного цикла
Outros autores:	Stuchebrov S. G. Sergey Gennadevich, Bulavskaya A. A. Angelina Aleksandrovna, Cherepennikov Yu. M. Yuriy Mihaylovich, Miloichikova I. A. Irina Alekseevna
Summary:	Title screen
Idioma:	inglés
Publicado:	2019
Series:	Applications of Monochromatic X-ray, [gamma]-ray
Subjects:	электронный ресурс труды учёных ТПУ профили пучки рентгеновские лучи сканирование плотность потоки частиц детекторы фотоны оптические волокна рентгеновские трубки фотоумножители
Acceso en liña:	http://earchive.tpu.ru/handle/11683/58028
Formato:	Electrónico Capítulo de libro
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=630971

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