Нанесение покрытия zrticu на заэвтектический силумин (20-22 вес.% Si) ионно-плазменным методом
| Parent link: | Перспективы развития фундаментальных наук=Prospects of Fundamental Sciences Development: сборник научных трудов XIV Международной конференции студентов, аспирантов и молодых ученых, г. Томск, 25-28 апреля 2017 г./ Национальный исследовательский Томский политехнический университет (ТПУ) ; под ред. И. А. Курзиной, Г. А. Вороновой.— , 2017 Т. 1 : Физика.— 2017.— [С. 306-308] |
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| Summary: | Заглавие с экрана In this article hyptreutectic silumin has been studied. The content of silicon is 20-22 wt.%. TiZrCu has been repositioned on this alloy. His thickness is 1 micron. Deposition performed by “TRIO”( Institute of High Current Electrons of the Siberian Branch of the Russian Academy of Sciences). In this article the structures before and after modification are shown. Microhardness grows more than 2 times, Nanohardness more than 5 times. Scanning microscopy shows that content of Ti, Zr, Cu are near 1%. |
| Language: | Russian |
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2017
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| Online Access: | http://earchive.tpu.ru/handle/11683/41468 |
| Format: | Electronic Book Chapter |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=622695 |