High performance microprocessor system for eddy current defectoscope measurement signal processing

Bibliographic Details
Parent link:Информационно-измерительная техника и технологии.— 2014.— [P. 220-223]
Main Author: Purgin A.
Corporate Author: Национальный исследовательский Томский политехнический университет (ТПУ) Институт неразрушающего контроля (ИНК) Кафедра физических методов и приборов контроля качества (ФМПК)
Other Authors: Yakimov E. V. Evgeny Valeryevich (научный руководитель)
Summary:Заглавие с экрана
This article shows principles of development of the eddy current defectoscope data acquisition system. It describes goals of development of this system and main requirements for its characteristics. Also on basis of these requirements possible implementation of the device was suggested.
Language:English
Published: 2014
Subjects:
Online Access:http://earchive.tpu.ru/handle/11683/23367
http://www.lib.tpu.ru/fulltext/c/2014/C18/038.pdf
Format: Electronic Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=613953