Thermal monitoring of the quality of analog and digital circuits; The Soviet journal of nondestructive testing; Vol. 20, iss. 6

Thermal monitoring of the quality of analog and digital circuits; The Soviet journal of nondestructive testing; Vol. 20, iss. 6

Bibliographic Details
Parent link:	The Soviet journal of nondestructive testing.— , 1965- Vol. 20, iss. 6.— 1984.— P. 388-391
Main Author:	Vavilov V. P. Vladimir Platonovich
Other Authors:	Kaiko V.L.
Summary:	Thermal monitoring of a voltage stabilizer and of digital-voltmeter indication circuits are described. Standard temperature profiles and half-tone thermograms are presented. The effect of monitoring modes and different actual and potential defects on its results is pointed out. В фонде НТБ ТПУ отсутствует
Language:	English
Published:	1984
Subjects:	труды учёных ТПУ
Format:	Book Chapter
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=601421

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