Thermal monitoring of the quality of analog and digital circuits

Bibliographic Details
Parent link:	The Soviet journal of nondestructive testing.— , 1965- Vol. 20, iss. 6.— 1984.— P. 388-391
Main Author:	Vavilov V. P. Vladimir Platonovich
Other Authors:	Kaiko V.L.
Summary:	Thermal monitoring of a voltage stabilizer and of digital-voltmeter indication circuits are described. Standard temperature profiles and half-tone thermograms are presented. The effect of monitoring modes and different actual and potential defects on its results is pointed out. В фонде НТБ ТПУ отсутствует
Language:	English
Published:	1984
Subjects:	труды учёных ТПУ
Format:	Book Chapter
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=601421

MARC


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200	1		\|a Thermal monitoring of the quality of analog and digital circuits \|f V. P. Vavilov, V.L. Kaiko
330			\|a Thermal monitoring of a voltage stabilizer and of digital-voltmeter indication circuits are described. Standard temperature profiles and half-tone thermograms are presented. The effect of monitoring modes and different actual and potential defects on its results is pointed out.
333			\|a В фонде НТБ ТПУ отсутствует
461			\|t The Soviet journal of nondestructive testing \|d 1965-
463			\|t Vol. 20, iss. 6 \|v P. 388-391 \|d 1984
610	1		\|a труды учёных ТПУ
700		1	\|a Vavilov \|b V. P. \|c Specialist in the field of dosimetry and methodology of nondestructive testing (NDT) \|c Doctor of technical sciences (DSc), Professor of Tomsk Polytechnic University (TPU) \|f 1949- \|g Vladimir Platonovich \|3 (RuTPU)RU\TPU\pers\32161 \|9 16163
701		1	\|a Kaiko \|b V.L.
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