Thermal monitoring of the quality of analog and digital circuits; The Soviet journal of nondestructive testing; Vol. 20, iss. 6
| Parent link: | The Soviet journal of nondestructive testing.— , 1965- Vol. 20, iss. 6.— 1984.— P. 388-391 |
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| Hovedforfatter: | |
| Andre forfattere: | |
| Summary: | Thermal monitoring of a voltage stabilizer and of digital-voltmeter indication circuits are described. Standard temperature profiles and half-tone thermograms are presented. The effect of monitoring modes and different actual and potential defects on its results is pointed out. В фонде НТБ ТПУ отсутствует |
| Sprog: | engelsk |
| Udgivet: |
1984
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| Fag: | |
| Format: | Book Chapter |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=601421 |
| Summary: | Thermal monitoring of a voltage stabilizer and of digital-voltmeter indication circuits are described. Standard temperature profiles and half-tone thermograms are presented. The effect of monitoring modes and different actual and potential defects on its results is pointed out. В фонде НТБ ТПУ отсутствует |
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