Vavilov V. P. Vladimir Platonovich & Kaiko V.L. (1984). Thermal monitoring of the quality of analog and digital circuits; The Soviet journal of nondestructive testing; Vol. 20, iss. 6. 1984.
Cita Chicago (17th ed.)Vavilov V. P. Vladimir Platonovich i Kaiko V.L. Thermal Monitoring of the Quality of Analog and Digital Circuits; The Soviet Journal of Nondestructive Testing; Vol. 20, Iss. 6. 1984, 1984.
Cita MLA (9th ed.)Vavilov V. P. Vladimir Platonovich i Kaiko V.L. Thermal Monitoring of the Quality of Analog and Digital Circuits; The Soviet Journal of Nondestructive Testing; Vol. 20, Iss. 6. 1984, 1984.
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