Detection of diffusion welding defects by thermal ndt of rectifier elements
| Parent link: | The Soviet journal of nondestructive testing.— , 1965- Vol. 19, iss. 5.— 1983.— P. 372-374 |
|---|---|
| अन्य लेखक: | , , , , , |
| सारांश: | Problems of flaw detection in contact joints in rectifier elements (RE) of semiconductor devices are considered investigating the possibility of applying thermal nondestructive testing to such elements. В фонде НТБ ТПУ отсутствует |
| भाषा: | अंग्रेज़ी |
| प्रकाशित: |
1983
|
| विषय: | |
| स्वरूप: | पुस्तक अध्याय |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=601416 |
समान संसाधन
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