Detection of diffusion welding defects by thermal ndt of rectifier elements
| Parent link: | The Soviet journal of nondestructive testing.— , 1965- Vol. 19, iss. 5.— 1983.— P. 372-374 |
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| Other Authors: | , , , , , |
| Summary: | Problems of flaw detection in contact joints in rectifier elements (RE) of semiconductor devices are considered investigating the possibility of applying thermal nondestructive testing to such elements. В фонде НТБ ТПУ отсутствует |
| Language: | English |
| Published: |
1983
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| Subjects: | |
| Format: | Book Chapter |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=601416 |