Detection of diffusion welding defects by thermal ndt of rectifier elements; The Soviet journal of nondestructive testing; Vol. 19, iss. 5

Bibliographische Detailangaben
Parent link:The Soviet journal of nondestructive testing.— , 1965-
Vol. 19, iss. 5.— 1983.— P. 372-374
Weitere Verfasser: Bragina L. A., Vavilov V. P. Vladimir Platonovich, Ivanov A. I., Korol'kov O. M., Surzhenkov G. N., Khutoryanskii E. D.
Zusammenfassung:Problems of flaw detection in contact joints in rectifier elements (RE) of semiconductor devices are considered investigating the possibility of applying thermal nondestructive testing to such elements.
В фонде НТБ ТПУ отсутствует
Sprache:Englisch
Veröffentlicht: 1983
Schlagworte:
Format: Buchkapitel
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=601416

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200 1 |a Detection of diffusion welding defects by thermal ndt of rectifier elements  |f L. A. Bragina [et al.] 
330 |a Problems of flaw detection in contact joints in rectifier elements (RE) of semiconductor devices are considered investigating the possibility of applying thermal nondestructive testing to such elements. 
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461 |t The Soviet journal of nondestructive testing  |d 1965- 
463 |t Vol. 19, iss. 5  |v P. 372-374  |d 1983 
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701 1 |a Bragina  |b L. A. 
701 1 |a Vavilov  |b V. P.  |c Specialist in the field of dosimetry and methodology of nondestructive testing (NDT)  |c Doctor of technical sciences (DSc), Professor of Tomsk Polytechnic University (TPU)  |f 1949-  |g Vladimir Platonovich  |3 (RuTPU)RU\TPU\pers\32161  |9 16163 
701 1 |a Ivanov  |b A. I. 
701 1 |a Korol'kov  |b O. M. 
701 1 |a Surzhenkov  |b G. N. 
701 1 |a Khutoryanskii  |b E. D. 
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